Manufacturer and model: J.A . Woollam alpha-SE
With fast measurement speed and push-button operation, the alpha-SE® is ideal for qualifying
thin films. Single-layer dielectrics on silicon or glass substrates can be measured in seconds.
Log results for easy-to-use comparisons in both graphical and tabular formats.
Advanced models allow quick and efficient fits for a wide variety of materials you may encounter.
- Diamond-like carbon
- Organic materials
- Organic LED films
Coating on Glass
Patented technology allows accurate measurements on any substrate: metal, semiconductor, or glass. For transparent substrates, the alpha-SE® measures depolarization to correct for light returning from the backside of the substrate. This unwanted light can confuse other ellipsometers, but the alpha-SE insures accurate optical constants.
Data Acquisition Rate
3 sec. (Fast mode) 10 sec. (Standard mode) 30 sec. (High-precision mode)
380nm to 900nm, 180 wavelengths
Angle of Incidence
65°, 70°, 75° or 90° (straight-through)